@article {2097, title = {Near-field magneto-optics and high density data storage. (With commentary)}, journal = {Applied Physics Letters.}, volume = {61}, year = {1992}, month = {1992}, abstract = {

Near-field scanning optical microscopy (NSOM) has been used to image and record domains in thin-film magneto-optic (MO) materials. In the imaging mode, resolution of 30-50 nm has been consistently obtained, whereas in the recording mode, domains down to -60 nm have been written reproducibly. Data densities of -45 Gbits/in.{\textquoteright} have been achieved, well in excess\ of current magnetic or MO technologies. A brief analysis of speed and other issues indicates that the technique may represent a viable alternative to density data storage needs.

Commentary: The first demonstration of optical recording and playback beyond the diffraction limit, using magneto-optic multilayer films and polarization contrast near-field microscopy. Bits as small as 60 nm were recorded {\textendash} beyond estimates at the time of the superparamagnetic limit to bit stability. Bit densities of 45 Gbits/in2 were also achieved, well in excess of optical or magnetic recording technologies of the era. In the years following this work, massive resources were spent on the commercialization of near-field data storage, largely for naught.

}, author = {Betzig, E and Trautman, J K and Wolfe, R and Gyorgy, E M and Finn, P L and Kryder, M H and Chang, C H} } @article {2093, title = {Near-field optics: microscopy, spectroscopy, and surface modification beyond the diffraction limit. (With commentary)}, journal = {Science}, volume = {257}, year = {1992}, month = {1992 Jul 10}, pages = {189-95}, abstract = {

The near-field optical interaction between a sharp probe and a sample of interest can be exploited to image, spectroscopically probe, or modify surfaces at a resolution (down to approximately 12 nm) inaccessible by traditional far-field techniques. Many of the attractive features of conventional optics are retained, including noninvasiveness, reliability, and low cost. In addition, most optical contrast mechanisms can be extended to the near-field regime, resulting in a technique of considerable versatility. This versatility is demonstrated by several examples, such as the imaging of nanometric-scale features in mammalian tissue sections and the creation of ultrasmall, magneto-optic domains having implications for highdensity data storage. Although the technique may find uses in many diverse fields, two of the most exciting possibilities are localized optical spectroscopy of semiconductors and the fluorescence imaging of living cells.

Commentary: An overview of our work in near-field optics at the time, after our invention of the adiabatically tapered fiber probe and shear force feedback (see below) led to the first practical near-field scanning optical microscope. In this work, superresolution imaging via absorption, reflectivity, fluorescence, spectroscopy, polarization, and refractive index contrast were all demonstrated. Unlike all far-field superresolution fluorescence methods that were to appear a decade later, near-field microscopy remains the only superresolution technique capable of taking advantage of the full panoply of optical contrast mechanisms.

}, issn = {0036-8075}, doi = {10.1126/science.257.5067.189}, url = {http://www.ncbi.nlm.nih.gov/pubmed/17794749}, author = {Betzig, E and Trautman, J K} } @article {2563, title = {Polarization contrast in near-field scanning optical microscopy.}, journal = {Applied Optics}, volume = {31}, year = {1992}, month = {1992 Aug 1}, pages = {4563-8}, abstract = {

Recent advances in probe design have led to enhanced resolution (currently as significant as \  12 nm) in optical microscopes based on near-field imaging. We demonstrate that the polarization of emitted and detected light in such microscopes can be manipulated sensitively to generate contrast. We show that the contrast on certain patterns is consistent with a simple interpretation of the requisite boundary conditions, whereas in other cases a more complicated interaction between the probe and the sample is involved. Finally application of the technique to near-filed magneto-optic imaging is demonstrated.

}, issn = {0003-6935}, doi = {10.1364/AO.31.004563}, author = {Betzig, E and Trautman, J K and Weiner, J S and Harris, T D and Wolfe, R} } @article {2564, title = {Breaking the diffraction barrier: optical microscopy on a nanometric scale.}, journal = {Science}, volume = {251}, year = {1991}, month = {1991 Mar 22}, pages = {1468-70}, abstract = {

In near-field scanning optical microscopy, a light source or detector with dimensions less than the wavelength (lambda) is placed in close proximity (lambda/50) to a sample to generate images with resolution better than the diffraction limit. A near-field probe has been developed that yields a resolution of approximately 12 nm ( approximately lambda/43) and signals approximately 10(4)- to 10(6)-fold larger than those reported previously. In addition, image contrast is demonstrated to be highly polarization dependent. With these probes, near-field microscopy appears poised to fulfill its promise by combining the power of optical characterization methods with nanometric spatial resolution.

}, issn = {0036-8075}, doi = {10.1126/science.251.5000.1468}, author = {Betzig, E and Trautman, J K and Harris, T D and Weiner, J S and Kostelak, R L} } @article {2095, title = {Breaking the diffraction barrier: optical microscopy on a nanometric scale. (With commentary)}, journal = {Science}, volume = {251}, year = {1991}, month = {1991 Mar 22}, pages = {1468-70}, abstract = {

In near-field scanning optical microscopy, a light source or detector with dimensions less than the wavelength (lambda) is placed in close proximity (lambda/50) to a sample to generate images with resolution better than the diffraction limit. A near-field probe has been developed that yields a resolution of approximately 12 nm ( approximately lambda/43) and signals approximately 10(4)- to 10(6)-fold larger than those reported previously. In addition, image contrast is demonstrated to be highly polarization dependent. With these probes, near-field microscopy appears poised to fulfill its promise by combining the power of optical characterization methods with nanometric spatial resolution.

Commentary: Introduced the adiabatically tapered single mode fiber probe to near-field scanning optical microscopy which, together with shear force feedback, made the technique a practical reality. Although earlier claims of superresolution via near-field microscopy existed for nearly a decade, this paper was the first to convincingly break Abbe{\textquoteright}s limit with visible light, as demonstrated by reproducibly resolving known, complex nanoscale patterns having features separated by much less than the wavelength. Whereas our fiber probe and shear force technologies were soon widely adopted and key to many novel applications (see above), the earlier methods proved to be technological dead ends, never achieving the results of their original claims. This experience taught me the most valuable lesson of my career: while it{\textquoteright}s bad to bullshit others, it{\textquoteright}s even worse to bullshit yourself. It{\textquoteright}s a lesson sadly unheeded by many current practitioners of superresolution microscopy.

}, issn = {0036-8075}, doi = {10.1126/science.251.5000.1468}, url = {http://www.ncbi.nlm.nih.gov/pubmed/17779440}, author = {Betzig, E and Trautman, J K and Harris, T D and Weiner, J S and Kostelak, R L} }