Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling.

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The Journal of Neuroscience: The Official Journal of the Society for Neuroscience. 2008 Mar 19;28(12):2959-64. doi: 10.1523/JNEUROSCI.3189-07.2008
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Serial section scanning electron microscopy of adult brain tissue using focused ion beam milling. Hess Lab
Knott G, Marchman H, Wall D, Lich B
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Abstract

PMID: 18353998 [PubMed - indexed for MEDLINE]

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Janelia Authors

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