Many-particle tracking with nanometer resolution in three dimensions by reflection interference contrast microscopy.

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Langmuir: The ACS Journal of Surfaces and Colloids. 2005 Jul 5;21(14):6430-5. doi: 10.1021/la050372r
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Many-particle tracking with nanometer resolution in three dimensions by reflection interference contrast microscopy.
Clack NG, Groves JT
Note: Research in this publication was not performed at Janelia.
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Abstract

We have developed and characterized a method, based on reflection interference contrast microscopy, to simultaneously determine the three-dimensional positions of multiple particles in a colloidal monolayer. To evaluate this method, the interaction of 6.8 microm (+/-5%) diameter lipid-derivatized silica microspheres with an underlying planar borosilicate substrate is studied. Measured colloidal height distributions are consistent with expectations for an electrostatically levitated colloidal monolayer. The precision of the method is analyzed using experimental techniques in addition to computational bootstrapping algorithms. In its present implementation, this technique achieves 16 nm lateral and 1 nm vertical precision.

PMID: 15982050 [PubMed - indexed for MEDLINE]

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Janelia Authors

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